Outline of S Parameter Measurement

Contents

• For maximum frequency 6GHz or less
• For maximum frequency 20GHz
• For maximum frequency 30GHz
• Notes

For maximum frequency 6GHz or less

1. Equipment

Network analyzer	8753D
Calibration kit	85033D
Test fixture	Inter-Continental Microwave Model WK-3001B or WK-3001D
DC power supply	6628A
Temperature chamber	ESPEC Model SU-240
Test substrate	Murata original substrate Material: Glass fluorine resin (0.32mm thick) Land pattern material: Copper foil (0.035mm thick),Gold plate (0.002mm thick) Microstrip-line: 20mm long, 0.86mm wide Er=2.57(2GHz)

2. Block diagram

Shown in Fig.1.



3. Condition

Capacitor

Calibration method	Full 2 port Calibration(Reflection, Transmission, Isolation)
Frequency range	C0G/C0H Characteristics : 300kHz-6GHz X7R/X5R/Y5V Characteristics : 30kHz-6GHz
Frequency points	401pts.
Circuit mode	Shunt thru mode

Inductor

Calibration method	Full 2 port Calibration(Reflection, Transmission, Isolation)
Frequency range	1MHz-6GHz
Frequency points	201pts.
Circuit mode	Series thru mode

4. Procedure

This S-parameter data is generally measured using the vector network analyzer (VNA) and the test fixture in 2 port circuit. But when the measuring frequency is higher than 1 GHz, it is difficult to separate the test fixture characteristics from the measured S-parameter data. Separating method of this test fixture is two ways. One is In Fixture Calibration Method using port extensions function key in VNA, another is a modeling method using a computer. This software has applied the modeling method.

First, the S-parameter of the test fixture and the microstrip line is measured and an equivalent circuit model is made. Then the model values of the test fixture are obtained. Next step, DUT is mounted on microstrip-line of the test substrate, and the S-parameter is measured. The equivalent circuit model elements of DUT and the test fixture are optimized using EDP simulator. Therefore, equivalent circuit model elements of DUT are deembedded removing elements of the test fixture from the measured S-parameter data.

In inductor measurement, equivalent circuit model element of the test fixture is generally calculated without any chips between the pads. However, at LQG15HS series, ( Not LQG15HN series ) equivalent circuit model element of the test fixture is calculated with a short chip ( 0.556nH ) between pads.

5. Land Pattern

Shown in Fig.2.

For maximum frequency 20GHz

1. Equipment

Network analyzer	8720D AGILENT TECHNOLOGIES
Test fixture	Inter-Continental Microwave Model WK-3001D
Test substrate	Murata original substrate Material: Glass fluorine resin (0.32mm thick) Land pattern material: Copper foil (0.035mm thick),Gold plate (0.002mm thick) Microstrip-line: 20mm long, 0.86mm wide Er=2.56(10GHz)

2. Block diagram

Shown in Fig.3.



3. Condition

Calibration method	TRL Calibration(Thru, Reflection, Line)
Frequency range	C0G/C0H Characteristics : 300kHz-20GHz
Frequency points	401pts.
Circuit mode	Shunt thru mode

4. Procedure

This S-parameter data is generally measured using the vector network analyzer (VNA) and the test fixture in 2 port circuit. The TRL calibration is used for the high frequency. Because the calibration plane is a signal line central part as shown in Fig.4, S parameter data of the chip unit can be obtained. The equivalent circuit model elements are obtained from S parameter data of the chip unit with a simulator for the circuit design.

5. Land Pattern

Shown in Fig.5.

For maximum frequency 30GHz

1. Equipment

Network analyzer	8720D AGILENT TECHNOLOGIES
Test fixture	Inter-Continental Microwave Model WK-3001D
Test substrate	Murata original substrate Material: Glass fluorine resin (0.16mm thick) Land pattern material: Copper foil (0.018mm thick),Gold plate (0.002mm thick) Microstrip-line: 6mm long, 0.45mm wide Er=2.56(10GHz)

2. Block diagram

Shown in Fig.6.



3. Condition

Calibration method	TRL Calibration(Thru, Reflection, Line)
Frequency range	C0G/C0H Characteristics : 50MHz-30GHz
Frequency points	401pts.
Circuit mode	Shunt thru mode

4. Procedure

This S-parameter data is generally measured using the vector network analyzer (VNA) and the test fixture in 2 port circuit. The TRL calibration is used for the high frequency. Because the calibration plane is a signal line central part as shown in Fig.7, S parameter data of the chip unit can be obtained. The equivalent circuit model elements are obtained from S parameter data of the chip unit with a simulator for the circuit design.

5. Land Pattern

Shown in Fig.8.

Notes