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Outline of S Parameter Measurement


This document is a description of the S-parameter measurement of ceramic chip capacitors and chip inductors.

Contents

For maximum frequency 6GHz or less

  1. Equipment
  2. Network analyzer8753D
    Calibration kit85033D
    Test fixtureInter-Continental Microwave Model WK-3001B or WK-3001D
    DC power supply6628A
    Temperature chamberESPEC Model SU-240
    Test substrate Murata original substrate
    Material: Glass fluorine resin (0.32mm thick)
    Land pattern material: Copper foil (0.035mm thick),Gold plate (0.002mm thick)
    Microstrip-line: 20mm long, 0.86mm wide
    Er=2.57(2GHz)

  3. Block diagram
  4. Shown in Fig.1.

    fig1

  5. Condition
  6. Capacitor
    Calibration methodFull 2 port Calibration(Reflection, Transmission, Isolation)
    Frequency rangeC0G/C0H Characteristics : 300kHz-6GHz
    X7R/X5R/Y5V Characteristics : 30kHz-6GHz
    Frequency points401pts.
    Circuit modeShunt thru mode

    Inductor
    Calibration methodFull 2 port Calibration(Reflection, Transmission, Isolation)
    Frequency range1MHz-6GHz
    Frequency points201pts.
    Circuit modeSeries thru mode

  7. Procedure
  8. This S-parameter data is generally measured using the vector network analyzer (VNA) and the test fixture in 2 port circuit. But when the measuring frequency is higher than 1 GHz, it is difficult to separate the test fixture characteristics from the measured S-parameter data. Separating method of this test fixture is two ways. One is In Fixture Calibration Method using port extensions function key in VNA, another is a modeling method using a computer. This software has applied the modeling method.

    First, the S-parameter of the test fixture and the microstrip line is measured and an equivalent circuit model is made. Then the model values of the test fixture are obtained. Next step, DUT is mounted on microstrip-line of the test substrate, and the S-parameter is measured. The equivalent circuit model elements of DUT and the test fixture are optimized using EDP simulator. Therefore, equivalent circuit model elements of DUT are deembedded removing elements of the test fixture from the measured S-parameter data.

    In inductor measurement, equivalent circuit model element of the test fixture is generally calculated without any chips between the pads. However, at LQG15HS series, ( Not LQG15HN series ) equivalent circuit model element of the test fixture is calculated with a short chip ( 0.556nH ) between pads.

  9. Land Pattern
  10. Shown in Fig.2.

    fig2

For maximum frequency 20GHz

  1. Equipment
  2. Network analyzer8720D AGILENT TECHNOLOGIES
    Test fixtureInter-Continental Microwave Model WK-3001D
    Test substrateMurata original substrate
    Material: Glass fluorine resin (0.32mm thick)
    Land pattern material: Copper foil (0.035mm thick),Gold plate (0.002mm thick)
    Microstrip-line: 20mm long, 0.86mm wide
    Er=2.56(10GHz)

  3. Block diagram
  4. Shown in Fig.3.

    fig3

  5. Condition
  6. Calibration methodTRL Calibration(Thru, Reflection, Line)
    Frequency rangeC0G/C0H Characteristics : 300kHz-20GHz
    Frequency points401pts.
    Circuit modeShunt thru mode

  7. Procedure
  8. This S-parameter data is generally measured using the vector network analyzer (VNA) and the test fixture in 2 port circuit. The TRL calibration is used for the high frequency. Because the calibration plane is a signal line central part as shown in Fig.4, S parameter data of the chip unit can be obtained. The equivalent circuit model elements are obtained from S parameter data of the chip unit with a simulator for the circuit design. fig4

  9. Land Pattern
  10. Shown in Fig.5.

    fig5

For maximum frequency 30GHz

  1. Equipment
  2. Network analyzer8720D AGILENT TECHNOLOGIES
    Test fixtureInter-Continental Microwave Model WK-3001D
    Test substrateMurata original substrate
    Material: Glass fluorine resin (0.16mm thick)
    Land pattern material: Copper foil (0.018mm thick),Gold plate (0.002mm thick)
    Microstrip-line: 6mm long, 0.45mm wide
    Er=2.56(10GHz)

  3. Block diagram
  4. Shown in Fig.6.

    fig6

  5. Condition
  6. Calibration methodTRL Calibration(Thru, Reflection, Line)
    Frequency rangeC0G/C0H Characteristics : 50MHz-30GHz
    Frequency points401pts.
    Circuit modeShunt thru mode

  7. Procedure
  8. This S-parameter data is generally measured using the vector network analyzer (VNA) and the test fixture in 2 port circuit. The TRL calibration is used for the high frequency. Because the calibration plane is a signal line central part as shown in Fig.7, S parameter data of the chip unit can be obtained. The equivalent circuit model elements are obtained from S parameter data of the chip unit with a simulator for the circuit design. fig7

  9. Land Pattern
  10. Shown in Fig.8.

    fig8

Notes

This S-parameter data contain the chip capacitor or inductor data itself, and it does not include the land pattern data. Therefore, when you simulate, please prepare the actual land pattern model you use.
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